Abstract
This article describes a new measurement system for the comparison of two electronic signals of different frequencies with application to high resolution comparison of laser wavelengths using a Michelson interferometer. It was built within the framework of research projects made by the University of Vigo and the Laboratorio Oficial de Metroloxía de Galicia (LOMG) in cooperation with Escolas Proval High School. The new hardware is based on a cheap high-speed module for the acquisition of data and a microcontroller module for processing, which can also be used for practical lessons in vocational training. The system has been tested with electronic signal generators. The novel measurement method reduces the uncertainty using multiple consecutive measurements and the fractional part of the fringes and could achieve precisions in the range 10-12 of the wavelength ratios.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
