Abstract
Two electron diffraction techniques using electronic hollow-cone illumination have been developed to improve the convergent beam electron diffraction method. One of them gives clear whole patterns of the higher order Laue-zone lines without diffraction disks. This technique also allows taking any higher order Laue-zone patterns. The other gives twice as large a convergent angle as that of the conventional convergent beam electron diffraction method and allows the combined use of high resolution electron microscopy and convergent beam electron diffraction.
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