Abstract

A novel fault-tolerant five-input majority gate for quantum-dot cellular automata is presented. Quantum-dot cellular automata (QCA) is an emerging technology which is considered to be presented in future computers. Two principle logic elements in QCA are “majority gate” and “inverter.” In this paper, we propose a new approach to the design of fault-tolerant five-input majority gate by considering two-dimensional arrays of QCA cells. We analyze fault tolerance properties of such block five-input majority gate in terms of misalignment, missing, and dislocation cells. Some physical proofs are used for verifying five-input majority gate circuit layout and functionality. Our results clearly demonstrate that the redundant version of the block five-input majority gate is more robust than the standard style for this gate.

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