Abstract
Journal Article New Developments in Automated Particle Analysis in the Electron Microscope - from Micro to Nano Get access Christian Lang, Christian Lang Oxford Instruments Nanoanalysis, High Wycombe UK Search for other works by this author on: Oxford Academic Google Scholar Matthew Hiscock, Matthew Hiscock Oxford Instruments Nanoanalysis, High Wycombe UK Search for other works by this author on: Oxford Academic Google Scholar James Holland, James Holland Oxford Instruments Nanoanalysis, High Wycombe UK Search for other works by this author on: Oxford Academic Google Scholar Susumu Yamaguchi, Susumu Yamaguchi Oxford Instruments KK, Tokyo, Japan Search for other works by this author on: Oxford Academic Google Scholar David Joyce, David Joyce Mantis Deposition Ltd., Thame, UK Search for other works by this author on: Oxford Academic Google Scholar Georgia Vatougia Georgia Vatougia Mantis Deposition Ltd., Thame, UK Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 21, Issue S3, 1 August 2015, Pages 337–338, https://doi.org/10.1017/S1431927615002482 Published: 23 September 2015
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