New density profile reconstruction methods in X-mode reflectometry.

Abstract

The reconstruction method published by Bottollier-Curtet and Ichtchenko in 1987 has been the standard method of density profile reconstruction for X-mode reflectometry ever since, with only minor revision. Envisaging improved accuracy and stability of the reconstruction method, functions more complex than the linear are evaluated here to describe the refractive index shape in each integration step. The stability and accuracy obtained when using parabolic and fixed or adaptative fractional power functions are compared to the previous method and tested against spurious events and phase noise. The developed relation from the plasma parameters to the best integration shapes allows for the optimization of the reconstruction for any profile shape. In addition, the density profiles can be reconstructed using less probing frequencies without accuracy loss, which speed up the reconstruction algorithm and enable real-time monitoring of faster density profile evolution.