Abstract
The combination of the Wave Concept Iterative Process (WCIP) method combined with the Short-Open Calibration SOC technique to micro strip discontinuity is presented. This SOC technique is directly accommodated in the WCIP method. It is used to remove the unwanted parasitic errors brought by the approximation of the impressed voltage sources and the feed lines. The WCIP is formulated in such a way that the port voltages and currents are explicitly represented through relevant network matrices. The scattering parameters of the filter structure can be obtained through the development and the simulation. This result for micro strip discontinuities is compared with the conventional WCIP method. These instructions provide you guidelines for preparing papers for International Journal. Use this document as a template and as an instruction set. Key words: Short open calibration (SOC), wave concept iterative process (WCIP), micro strip discontinuity, third-order filter.
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