Abstract
The installation of a new 1.0 MV Tandetron accelerator and a recent upgrade of the 6.0 MV Tandem Van de Graaff accelerator increased the application possibilities of the Zagreb ion microbeam system. Several ion sources enable now the selection of a wide variety of ions. Most of them can be focused by the existing microprobe system. Sample positioning tools and new scanner control options are implemented in the new generation of SPECTOR data acquisition system. Details of the upgrades are presented.
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