Abstract
Nowadays, electro-optic sampling based on ultra-short optical pulses becomes more and more attractive for microwave engineers developing monolithic microwave integrated circuits. Moreover, due to growing clock rates this test technique is also of interest for the function and failure analysis of high-speed digital circuits. In the last years a lot of work has been done to fit this technique to todays' requirements and to make it usable for circuits designers. Therefore, in this paper an overview of the state of the art and of current topics in electro-optic sampling is given. Two examples, one from analog circuits, the high-frequency signal injection to the device under test, and one from digital circuits, the improvement of spatial resolution, will be discussed in detail.
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