New aspect of diffraction of a highly divergent characteristic X-ray beam

Abstract

A new way of implementing the diffraction of a highly divergent characteristic X-ray beam has been developed. This method is based on the formation of a diffraction image by the X rays exiting particular (active) points on the crystal surface which lie on hyperbolas. There is a correspondence between the points on the crystal surface and the points in the diffraction image. Local distortions of the crystal structure lead to local deviations of the diffraction lines from proper hyperbolas. This method makes it possible to reveal the block structure of crystals, separate blocks, and estimate the degree of misorientation.