New Approach in Analysis of Sensitivity of Temperature Response to Selected Parameters of Two-Layer Structure

Abstract

The analysis of the temperature response versus frequency of excitation provides information about the depth profile of the thermal parameters of the examined objects. The main parameters that determine the amplitude and the phase of the temperature response are: the frequency of thermal excitation, the thermal effusivities, and the relative thermal thicknesses of particular layers. The sensitivity of the amplitude and the phase of the thermal wave signal to changes of particular thermal parameters has been defined by partial derivatives of amplitude or phase with respect to those parameters. On the other hand, the method proposed in this article consists of the analysis of the sensitivity of the thermal response to relative changes of thermal parameters of object layers. The advantage of such a solution is the possibility of determining the optimal measurement conditions and assessing relative errors of measured values.