Abstract
We describe the use of neutron scattering techniques such as reflectivity and diffractionfor the study of oxide thin films. We first describe how neutron reflectivity cancomplement x-ray reflectivity for the study of some oxide materials. We then emphasizemagnetic thin films which have become an important field of study in the 1990s,following the discovery of new phenomena in heterostructures: magnetic exchangecoupling, exchange bias coupling at antiferro/ferromagnetic interfaces, enhancedmagnetism in ultrathin films or tunnel magnetoresistance for example. We showhow neutron scattering can provide detailed quantitative information about themagnetization depth profiles of thin films and about the magnetic order in epitaxialfilms.
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