Abstract

The ever increasing need for product advancement and miniaturization keeps thin film assemblies, membranes, magnetic and non-magnetic multilayer and patterned heterostructures in the limelight of materials science and technological development. A number of thin film and surface characterization methods have emerged recently to meet the new challenges. The increased interest in magnetic thin film analytical instruments – mainly triggered by the discovery of the giant magnetoresistance and related phenomena [1] – resulted in a boom of Polarized Neutron Reflectometry studies as well as in construction of a number of new neutron reflectometers with polarization option. This article reports on the design, construction and operation parameters and first example uses of the “Grazing Incidence Neutron Apparatus” (GINA) a recently installed neutron reflectometer at the Budapest Neutron Centre (BNC) in Hungary.

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