Abstract
A polymer brush system of a neutral polymer poly (ethylene glycol) with a molecular weight of Mw = 20 kDa on silicon substrates in an aqueous medium was studied by the specular neutron reflectometry. Structural changes in the density profile of a polymer brush caused by the interaction of polymer chains with micelles of the anionic surfactant dodecylbenzenesulfonate acid were observed. The effect is shown to be related to the formation of molecular polymer-micelle associates in the bulk of the solution, which was previously studied by small-angle neutron scattering in a wide range of surfactant concentrations at various molecular weights of the polymer. The density of the dry polymer layer on the silicon substrate was additionally characterized by X-ray reflectometry and scanning atomic force microscopy.
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