Abstract
AbstractRecycling electronic waste (WEEE) is a fundamental aspect of the circular economy. To develop technology and assess its economic aspects, the composition characterization of the waste items is crucial. Neutron-based analytical techniques, such as the INAA, in-beam NAA, and PGAA, are applicable to measure the elemental composition of WEEE. These techniques are bulk representative and offer simultaneous determination of the relevant elements without sample dissolution. This study explores the suitability of neutron-based elemental analysis methods for measuring common WEEE items, e.g., printed circuit boards and integrated circuits. Matrix effects mostly related to the thermal neutron self-shielding, were identified and successfully corrected, ensuring accurate mass fraction measurements.
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