Abstract
The lattice parameter dependence of the Néel temperature TN of thin Cr2O3 in a Cr2O3/Co exchange-coupled system is investigated. Lattice-mismatch-induced strain is generated in Cr2O3 by using different buffer layers. The lattice parameters are determined from out-of-plane and in-plane X-ray diffraction measurements. The Néel temperature is detected by direct temperature-dependent magnetization measurement as well as the temperature-dependent interface exchange coupling energy. It is observed that in-plane lattice contraction can enhance TN in Cr2O3, which is consistent with theoretical calculations.
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