Abstract
Speckle pattern-based characteristics of digital image correlation (DIC) restrict its application in engineering fields and nonlaboratory environments, since serious decorrelation effect occurs due to localized sudden illumination variation. A simple and efficient speckle pattern adjusting and optimizing approach presented in this paper is aimed at providing a novel speckle pattern robust enough to resist local illumination variation. The new speckle pattern, called neighborhood binary speckle pattern, derived from original speckle pattern, is obtained by means of thresholding the pixels of a neighborhood at its central pixel value and considering the result as a binary number. The efficiency of the proposed speckle pattern is evaluated in six experimental scenarios. Experiment results indicate that the DIC measurements based on neighborhood binary speckle pattern are able to provide reliable and accurate results, even though local brightness and contrast of the deformed images have been seriously changed. It is expected that the new speckle pattern will have more potential value in engineering applications.
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