Abstract
We applied displacement current measurement (DCM) to an organic solar cell (OSC) with a structure of ITO/CuPc/C60/BCP/Al in order to investigate the origin of a negative capacitance (NC). In DCM curve, an anomalous characteristic that the current in backward scan was larger than that in forward scan was observed. We found that this characteristic originates from a gradual increase of an additional current, leading to NC in DCM. The additional current can be explained by the increase of the device temperature owing to a Joule heat and thermal deactivation of the exciton. Moreover, NC value was observed to be enhanced by light irradiation due to an additional temperature increase.
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