Needing measurements and instrumentation within the nanotechnology world: IEEE IMS TC-34 experience

Abstract

Nanotechnology is, first of all, an issue regarding dimensional aspects that have an impact on all the other considerations. Depending on the interest area, the impact of nanotechnology is observed in design, fabrication process, and utilization. To cope with certification procedures, for instance, and their performance, measurements and instrumentation are key points of this complex mosaic. The IEEE Instrumentation and Measurement Society (IMS) developed a technical committee to strongly deal with nanotechnology in instrumentation and measurements called TC-34. Its activities are introduced here, along with a description of its spinoff event called NANOfIM which is a conference with an insight into the nanotechnology world. The first NANOfIM was held in 2015 in Lecce (Italy).