Abstract

Aggressive power supply scaling into the near-threshold voltage (NTV) region holds great potential for applications with strict energy budgets, since the energy efficiency peaks as the supply voltage approaches the threshold voltage (VT) of the CMOS transistors. The improved silicon energy efficiency promises to fit more cores in a given power envelope. As a result, many-core Near-threshold computing (NTC) has emerged as an attractive paradigm. Realizing energy-efficient heterogenous system on chips (SoCs) necessitates key NTV-optimized ingredients, recipes and IP blocks; including CPUs, graphic vector engines, interconnect fabrics and mm-scale microcontroller (MCU) designs. We discuss application of NTV design techniques, necessary for reliable operation over a wide supply voltage range—from nominal down to the NTV regime, and for a variety of IPs. Evaluation results spanning Intel’s 32-, 22- and 14-nm CMOS technologies across four test chips are presented, confirming substantial energy benefits that scale well with Moore’s law.

Highlights

  • Near-threshold computing promises dramatic improvements in energy efficiency

  • The 2 × 2 2-D mesh-based resilient NoC prototype is fabricated in a 22 nm, 9-metal layer

  • The 2 × 2 2-D mesh-based resilient NoC prototype is fabricated in a 22 nm, 9-metal layer technology

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Summary

Introduction

Near-threshold computing promises dramatic improvements in energy efficiency. CMOS designs, the energy consumption reaches an absolute minimum in the NTV regime that is of the order of magnitude improvement over super-threshold operation [1,2,3]. Frequency degradation due to aggressive voltage scaling may not be acceptable across all single-threaded or performance-constrained applications. The key challenge is to lock-in this excellent energy efficiency benefit at NTV, while addressing the impacts of (a) loss in silicon frequency, (b) increased performance variations and (c) higher functional failure rates in memory and logic circuits. Enabling digital designs to operate over a wide voltage range is key to achieving the best energy efficiency [2], while satisfying varying application performance demands. To tap the full latent potential of NTC, multi-layered co-optimization approaches that crosscut architecture, devices, design, circuits, tool flows and methodologies, and coupled with fine-grain power management techniques are mandatory to realize NTC circuits and systems in scaled CMOS process nodes

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