Abstract

Summary form only given. The ability of ferroelectric materials such as Pb(Zr/sub x/Ti/sub 1-x/)O/sub 3/ (PZT) piezoceramics to switch from one stable polarization state to another forms the basis of a new thin film technology for data storage. Thin PZT films are used in prototype nonvolatile ferroelectric random access memory (NVFRAM) and dynamic random-access memory (DRAM) devices. We report second harmonic imaging of the surface of a PZT ceramic obtained in a near-field microscopy setup using a Ti:sapphire laser system consisting of an oscillator and a regenerative amplifier operating at 810 nm.

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