Near‐field optical images of subwavelength annular aperture arrays exhibiting an extraordinary transmission

Y Poujet,F I Baida,J Salvi,P Hoffmann,A Perentes,D Van Labeke,C Santschi

doi:10.1111/j.1365-2818.2008.01887.x

Abstract

In this paper, we present near-field optical images of nanostructures exhibiting an extraordinary transmission. These structures consist of annular aperture arrays engraved in a metallic film: they are quite promising structures for nanophotonics because of their high transmission directly linked to a guided mode mediated by each annular aperture. We first briefly explain our fabrication process (focused ion beam milling), then we expose the experimental setup of the near-field optical microscope working both in reflection and transmission modes. For the reflection mode, the 'coffee-bean' structure of the electromagnetic field predicted by the theory has been quite well reproduced. For the transmission mode, we present preliminary experimental results concerning the influence of the wavelength and the polarization of the incident beam on the obtained near-field images.

Highlights

It is well known that light can substantially pass through subwavelength nano-apertures in a thick metallic film (Ebbesen et al, 1998; Martin-Moreno et al, 2001), unlike the hasty predictions that can be deduced from the ‘classical’ theory (Bethe, 1944; Bouwkamp, 1954)
After having explained our fabrication process and our calculation method, we present experimental results obtained with a reflection scanning tunneling optical microscope (RSTOM)
Compared to focused electron beam (FEB) lithography, focused ion beam (FIB) milling is an adequate technique for rapid fabrication of prototype optical nanostructures (Perentes et al, 2005)

Summary

We present near-field optical images of nanostructures exhibiting an extraordinary transmission. These structures consist of annular aperture arrays engraved in a metallic film: they are quite promising structures for nanophotonics because of their high transmission directly linked to a guided mode mediated by each annular aperture. We first briefly explain our fabrication process (focused ion beam milling), we expose the experimental setup of the near-field optical microscope working both in reflection and transmission modes. The ‘coffee-bean’ structure of the electromagnetic field predicted by the theory has been quite well reproduced. We present preliminary experimental results concerning the influence of the wavelength and the polarization of the incident beam on the obtained near-field images

Introduction

Conclusion