Abstract
18O tracer exchange experiments were performed on donor doped PZT under an applied voltage and analyzed by time-of-flight (ToF) secondary ion mass spectrometry (SIMS) measurements. The application of a voltage enhanced the oxygen diffusion coefficient perpendicular to the field, i.e. between the electrodes and evidence is provided that grain boundary diffusion of oxygen is accelerated. Additionally, changes in the surface resistivity across grain boundaries were observed by conductive mode (CM) microscopy. The field induced time-dependent resistivity changes originated from the cathode, and led to a breakdown of grain boundary barriers and to areas of homogeneous resistivity.
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