Abstract
We report a near-stoichiometric Ti:Zr:LiNbO(3) strip waveguide fabricated from a congruent substrate with a technological process in the following sequence: Zr4+-diffusion-doping, diffusion of 8-μm-wide, 100-nm-thick Ti strips, and post-Li-rich vapor transport equilibration. We show that Zr(4+)-doping has little effect on the LiNbO(3) refractive index, and the waveguide is in a near-stoichiometric environment. The waveguide well supports both the TE and TM modes, shows weak polarization dependence, is in single mode at the 1.5 μm wavelength, and has a loss of ≤0.6/0.8 dB/cm for the TE/TM modes. A secondary ion mass spectrometry analysis shows that the Zr(4+)-profile part with a concentration above the threshold of photorefractive damage entirely covers the waveguide, implying that the waveguide would be optical-damage resistant.
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