Abstract
We use near-field polarimetry (NFP) to investigate thin-film crystallites of isotactic polystyrene (iPS). NFP micrographs enable quantitative optical characterization of the birefringence in these specimens with subdiffraction-limited resolution, resulting in observations that give: (1) evidence for radial strain in the depletion boundary surrounding the growth front, and (2) a map of local tilt in the crystal axis and/or strain in the amorphous layers above and below the growth plane of the crystallites.
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