Abstract
This study presents a near-field immunity test (NFIT) method for the fast debugging of radiated susceptibility of industrial devices. The proposed approach is based on the development of an NFIT setup which comprises of developed near-field electric and magnetic field probes and device under test (DUT). The developed small-size and handy near-field testing probes inject the high electric (up to 1000 V/m) and magnetic (up to 2.4 A/m) fields on the DUT in the radar pulse ranges (1.2 to 1.4 GHz and 2.7 to 3.1 GHz) with the lower fed input power (up to 15 W) from the power amplifier in the developed NFIT setup. The proof of concept is validated with the successful near-field immunity debugging of an electric power steering (EPS) device used in the automotive industry with the developed NFIT setup. The radiated susceptibility debugging test results of developed NFIT method and conventional method of ISO 11452-2 test setup turned out to be close to each other for the tested DUT in immunity performance. The proposed procedure has advantages of industry usefulness with fast, handy, and cost-effective radiated immunity debugging of the DUT without the requirement of large antenna, high-power amplifiers, optical DUT connecting harness, and an anechoic chamber as needed in ISO 11452-2 standard setup for the debugging analysis.
Highlights
Modern technologies have revolutionized the manufacturing of autonomous and non-automated road vehicles
Besides the highly integrated “on-vehicle” EM sources such as antennas used for cellular communication, global positioning system (GPS) systems, navigation system, vehicle tracking, WiFi, dedicated short-range communications (DSRC), Internet of Things (IoT) connectivity, and automotive radars, etc., “off-vehicle” man-made or natural EM sources could have an adverse impact on vehicle system performance [1,3,4]
Waves on the device under test (DUT) attached harness as needed in international organization for standardization (ISO) 11452-2 for the same. It should be mentioned here, again, that the proposed near-field immunity test (NFIT) method did not quantify the electromagnetic compatibility (EMC) quality compliance testing of the automotive electronic DUT as per the requirements of [9,10]. It just acts as a handy useful industry experimental tool to quickly debug the errors in the functionality of the electronic device with the real-time monitoring of the performance signals and, its fast repairing and error rectification, which offers the additional advantages of the rapid production and lesser time to market of the product
Summary
Modern technologies have revolutionized the manufacturing of autonomous and non-automated road vehicles. The good thing in the proposed method is to monitor the real DUT performance signals during the test as needed for root-cause analysis, because the injected electric and magnetic fields from the designed probes are local and are not affecting the monitoring equipment (e.g., oscilloscope) and attached harness as compared to Figure 1 setup [11]. The proposed NFIT method could be used for the fast debugging of the DUT to perform the root-cause analysis with handy experimental setup in a laboratory environment at a lower cost as compared to repeating the same experimental procedure in the costly and time-consuming far-field test setup of Figure 1
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