Abstract

The aim of this review paper is to discuss some of the advanced sampling techniques proposed in the last decade in the framework of planar near-field measurements, clarifying the theoretical basis of the different techniques, and showing the advantages in terms of number of measurements. Instead of discussing the details of the techniques, the attention is focused on their theoretical bases to give a gentle introduction to the techniques. For each sampling method, examples on a liner array are discussed to clarify the advantages and disadvantages of the method.

Highlights

  • Antenna measurement is an active field of research, with large industrial impact

  • Near field measurements can be affected by many causes of uncertainty, including the finite size of the scanning area where the field radiated by the Antenna Under Test (AUT) is measured, the presence of reflections and scattering from the environment, small shifts of the measurement positions, the use of non-ideal probes, the presence of multiple reflection between the AUT and the probe, and an erroneous sampling of the near-field that does not allows collecting all the information required for the NearField-Far Field (NF-FF) transformation process [3]

  • This paper focuses its attention on the practical aspects of the use of Compressed Sensing/Sparse Recovery (CS/SR), with particular emphasis toward array diagnosis, showing that CS/SR allows an effective interpolation of the field using a number of samples much lower than linear interpolation

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Summary

Introduction

Antenna measurement is an active field of research, with large industrial impact. Effective measurement techniques include Far-Field (FF), compact range, and Near-Field (NF) systems [1]. The Hilbert–Smith decomposition allows obtaining both the optimal basis function to represent the field on the measurement plane Ω (i.e., the right singular functions) and the number of basis required to represent the field within a given approximation, which is equal to the number of singular values above the noise level plus one This number, called the Number of Degrees of Freedom (NDF) of the electromagnetic field [9] In the following, we consider a linear array of λ/2 equispaced elements, and we compare the number of samples required to represent the field with the lower bound obtained

Standard Sampling Representation in Planar Near-Field Measurement Systems
The Minimum Redundant Sampling
Nonlinear Interpolation
Conclusions
A Priori Information
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