Abstract
We present near-edge measurements for $K$-absorption edges of Ni-, Fe-, and Co-implanted ultrahigh quality single-crystal and polycrystalline $\mathrm{Y}{\mathrm{Ba}}_{2}{\mathrm{Cu}}_{3}{\mathrm{O}}_{7\ensuremath{-}\ensuremath{\delta}}$ (YBCO). The samples were implanted using a metallized vapor vacuum arc high current ion source with a dose of approximately 1\ifmmode\times\else\texttimes\fi{}${10}^{17}$ ions/${\mathrm{cm}}^{2}$, and subsequently annealed in an oxygen atmosphere for approximately 100 h. The results show that upon annealing the Feimplanted sample has a valence structure that is consistent with doped powder studies. This suggests the substitution within the lattice in the Cu(1) and Cu(2) sites for the implanted ions, while the nickel implant case showed a valence structure closer to NiO with no shift in edge energy being observed during the anneal process. This was similar to the Co-implanted result that also showed very little change in valence structure after annealing, with a valence closer to ${\mathrm{Co}}^{3+}$. We also performed Cu $K$-edge absorption measurements of the implanted materials in comparison with YBCO and found no change in edge energy or structure. The results are consistent with previous susceptibility studies.
Published Version
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