Near-Edge X-Ray Absorption Fine Structure Study of Vertically Aligned Carbon Nanotubes Grown by the Surface Decomposition of SiC

Abstract

Vertically aligned carbon nanotubes (CNTs) grown by the surface decomposition of SiC were studied by angular-dependent C K-edge near-edge X-ray absorption fine structure spectroscopy (NEXAFS) with a linearly polarized X-ray beam. The NEXAFS spectra measured in total electron yield mode showed a distinct angular dependence on π* and σ* resonances and the orientation parameter was tentatively estimated to be 0.38, which is fairly larger than those reported for other vertically aligned CNTs grown by chemical vapor deposition. The high order of the vertical alignment of CNTs grown by the surface decomposition of SiC was demonstrated by NEXAFS measurements for the first time.