Abstract
We report near-edge absorption fine structure (NEXAFS) and UV photoemission spectroscopy (UPS) studies of aligned single-walled carbon nanotube films on Si(100) substrates. Orientation of the films was detected in the NEXAFS spectra, with the intensity of the π* core exciton at 284.4 eV showing a strong dependence on nanotube alignment with respect to the polarization of the incident radiation. At lower angles of incidence, the intensity of the π* peak was higher for all orientations, which we attribute to the greater accessibility of the π* orbitals. UPS spectra of the films showed little angular dependence and included features consistent with the total density of states of graphite. As a result of the nanotube curvature and the distribution of nanotube chiralities, the UPS spectra are similar to angle-integrated graphite spectra.
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Schedule a callMore From: Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena
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