Abstract
In this paper, the near-carrier enhancement of phase-noise (PN) at turnover temperature ( ${T} _{to}$ ) in a quasi-thickness-Lame (QTL) mode thin-film piezoelectric-on-silicon (TPoS) oscillator is reported for the first time. QTL-TPoS resonators fabricated on degenerately-doped n-type silicon offer a ${T} _{to}$ greater than 80°C and are suitable for implementation of highly-stable ovenized oscillators. In this work, a ~123MHz QTL-TPoS resonator is heated up to ${T} _{to}$ (~90°C) by injecting current through the silicon body of the resonator. It is experimentally observed that at turnover temperature, the phase-noise slope close to the carrier frequency ( $\Delta $ f 100Hz ) decreases substantially in contrast to the expected trends. A ~10dB improvement in phase noise at 10Hz offset and a ~25dB improvement at 1Hz offset is recorded when the oscillator is operating at ${T} _{to}$ compared to room temperature. [2020-0206]
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