Abstract
A novel microwave imaging (MI) method is proposed to deal with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures. The proposed technique exploits a probabilistic differential contrast source inversion (D-CSI) formulation of the inverse scattering (IS) problem, which is then effectively solved by means of a customized multi-task Bayesian compressive sensing (MT-BCS) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed NDT/NDE method, as well as to compare it. with a single-task (ST-BCS) implementation within the same framework.
Highlights
To cite this article: Giorgio Gottardi et al 2020 J.
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Summary
To cite this article: Giorgio Gottardi et al 2020 J. Æ Ì»Æ Ý Ñ Ò× Ó ÔÖÓ Ð ×Ø Ö ÒØ Ð ÓÑÔÖ ×× Ú × Ò× Ò Ñ Ø Ó ×ÓÐÙØ ÓÒ× Ý Ö Ù ÒØÖØÓ ØÛ Ò ÔÖÓ Ð Ñ ÙÒ ÒÓÛÒ× Ò ÒÓÒ1Ö ÙÒ ÒØ» Ò ÓÖÑ Ø Ú
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