Abstract
Transmission electron microscopy (TEM) and X-ray diffraction (XRD) have been used to study the morphology and the lattice parameters, respectively of the diamond cubic SiGe precipitates that are present in peak aged, and in subsequently crept samples of a ternary Al-Ge-Si alloy. TEM reveals that there exist variations in the morphology of the SiGe precipitates within the microstructures under all conditions, and that nucleation of SiGe precipitates occurs in the alloy during creep. X-ray diffraction studies reveal that the lattice parameter of the SiGe precipitates present in the peak aged alloy does not change due to either over ageing or subsequent creep deformations, whilst, formation of SiGe precipitates having a different lattice parameter is detected under certain creep conditions.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
