Abstract
Angle-resolved electron energy loss spectroscopy (AREELS) has been studied on the Si(111)7×7 surface by using a retarding field analyzer in a medium electron energy range (150≤ E p ≤1000 eV) at the glancing incidence. Some fine structures are distinctly observed of surface and bulk state transitions as well as plasmon losses in the energy distribution curves N ( E ) at the specular Bragg reflection, but no transitions except for plasmon losses are observed at the back-ground position. AREELS spectra at the specular Bragg reflection are compared with those at the background position and with conventional angle-integrated electron energy loss spectra. AREELS spectra at the specular reflection are measured as a function of the primary energy around Bragg conditions.
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