Native defects and dopants in gan studied through photoluminescence and optically detected magnetic resonance

Abstract

Native defects and dopants in GaN grown by organometallic chemical vapor deposition have been studied with photoluminescence and optically detected magnetic resonance. For undoped samples, the combined results indicate the presence of residual shallow donors and acceptors and deep donors. A model for the capture and recombination among these defects is developed. For Mg-doped samples, the experiments reveal shallow and perturbed acceptors and shallow and deep donors. Hence, shallow and deep states for the native donor or donors appear in all samples. The Mg-acceptor is perturbed from its effective-mass state by nearby point defects.