Abstract

Second generation high temperature superconducting coated conductors (2G HTS CCs) have become indispensable wires for high-field superconducting magnets. The transverse mechanical delamination strength (MDS) is a key parameter due to the multilayer structure of CCs. Determination of the MDS value is thus significant. In this study, we report the MDS results of national round robin test (RRT) conducted in china by the institutions of Lanzhou University, Institute of Plasma Physic, and Shanghai Superconductor Technology Co., Ltd at room temperature (RT) and 77 K, respectively, for the determination of 2G HTS CCs (copper-stabilized) transverse MDS by a standardized procedure. Data at RT and 77 K all showed good consistency, with the relative standard uncertainty of 2.22% and 2.35%, respectively, illustrating the reliability of the established procedure, which can be used as a reference for engineering CC manufacturing and design of application magnets.

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