Abstract
The submicrometer length scale is mostly beyond the resolution of classical tribometers. The Scanning Force and Friction Microscope operated as a nanotribometer is a suitable tool for the investigation of nanotribological properties. The Scanning Force and Friction Microscope measures simultaneously forces normal and parallel to the sample surface with a resolution down to the atomic scale. The setup of a Scanning Force Microscope based nanotribometer, its calibration and the methods for quantitative data analysis are discussed. It is shown that a two-dimensional histogram analysis yields quantitative data on the distribution of the indium on a nanometer scale. The concepts are applied to the analysis of a silicon oxide surface with indium clusters are discussed. The chemical sensitivity of the Scanning Force and Friction Microscope operated under ambient condition makes this instrument a promising candidate for a standardized tool in nanotribology.
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