Abstract
Transmission electron microscopy (TEM) and X-ray diffraction (XRD) were used to examine the nanostructure of a natural polymer—a spider dragline silk—that has potential applications as an engineering material. The silk studied was collected from the cob-web weaving spider Latrodectus hesperus. Single crystal and polycrystalline electron diffraction patterns indicate the presence of crystals with a bimodal size distribution, in the range of 2nm and 40–120nm. The chain axis of the smaller crystals is more strictly aligned with the fiber axis than that of the larger crystals. Lattice parameters for the orthogonal unit cell are: a=9.4Å (interchain), b=7.0Å (dipeptide, fiber axis) and c=10.8Å (intersheet). A fine structure in single crystal electron diffraction patterns indicates possible composition-dependent lattice strains. Results of tensile tests of the spider dragline silk are reported, and a simple model is presented linking the observed nanostructural features to the force-elongation response of this material.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
