Nanostructural Characterization Of Amorphous Chalcogenides By X-Ray Diffraction And Positron Annihilation Techniques

T. Kavetskyy,J. Filipecki,W. Hoyer,O. Shpotyuk,I. Kaban

doi:10.1007/978-1-4020-9916-8_41

Nanostructural Characterization Of Amorphous Chalcogenides By X-Ray Diffraction And Positron Annihilation Techniques

T. Kavetskyy, J. Filipecki + Show 3 more

https://doi.org/10.1007/978-1-4020-9916-8_41

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Publication Date: Jan 1, 2009

Citations: 1

Affiliation: Jan Długosz University, Chemnitz University of Technology

#First Sharp Diffraction Peak #Positron Annihilation Lifetime Spectroscopy + Show 8 more

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Abstract

Nanostructural features of binary As–Se(Te), pseudo-binary As2S(Se)3–Sb2S(Se)3, ternary stoichiometric As(Sb)2S3–GeS2 and nonstoichiometric As(Sb)2S3–Ge2S3 chalcogenide glasses are studied by using conventional X-ray diffraction, high-energy synchrotron X-ray diffraction and positron annihilation lifetime spectroscopy (PALS). Compositional trends of the position of the first sharp diffraction peak (FSDP) (size of nanovoids) are analyzed within the void-based model as well as cationcorrelation approaches along with the PALS results. The dominant cation correlations responsible for the FSDP occurrence and sizes of nanovoids are established in dependence on the type of the glass structure. lifetime spectroscopy; nanostructure; nanovoids

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