Abstract
In order to understand the formation of nano-size magnetic domains in Co/sub 76/Cr/sub 24/ thin films for ultra-high density perpendicular magnetic recording, film thickness and sputtering gas pressures were investigated using a facing target sputtering (FTS) apparatus. Investigations of these films showed thy were composed of highly oriented hcp crystallites with lower Cr content (C/sub Cr/) of isolated ferromagnetic areas uniformly distributed in the higher C/sub Cr/ host paramagnetic matrix. The diameter of the lower C/sub Cr/ areas in these films was between 3-5 nm. The perpendicular coercivity in the surface region was greater than 2400 Oe. Consequently, this film is considered to be a good candidate for perpendicular magnetic recording densities approaching 1000 Kfci (10 Gb/in/sup 2/).
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