Abstract
We demonstrate that scattering-type scanning near-field optical microscopy (s-SNOM) allows nanoscale-resolved imaging of objects below transparent surface layers at both visible and mid-infrared wavelengths. We show topography-free subsurface imaging at lambda=633 nm. At lambda=10.7 microm, gold islands buried 50 nm below a polymer surface are imaged with a lateral resolution < 120 nm, corresponding to lambda/90. Studying oxide layers with systematically varied thicknesses we provide experimental evidence of mid-infrared near-field probing in depths > 80 nm.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
