Abstract
Block copolymer (BCP) thin films are commonly characterized by techniques that either lack nanometric spatial resolution or the ability for subsurface characterization. In this work, we combine scanning near-field optical microscopy and atomic force microscopy mechanical mapping to probe the subsurface composition of poly(styrene-block-tert-butyl acrylate) thin film with nanometric spatial resolution and compare our results to a theoretical description. Our work demonstrates a novel imaging approach for interrogating the internal morphology of BCP thin films. A better understanding of subsurface morphologies will enable better design principles for nanolithography and templating thin films for photonics, photovoltaics, and tissue engineering.
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