Nanoscale phase separation of CuI–Cu 2MoO 4 superionic conducting glass studied by analytical transmission electron microscopy

Abstract

Microstructures of CuI–Cu 2MoO 4 superionic conducting glasses have been studied by analytical transmission electron microscopy equipped with high angle annular detector dark field (HAADF) detector and energy dispersive X-ray spectroscopy (EDS). Structural inhomogeneities of 5–10 nm in size are observed from HAADF images in the glass. Deference of composition between bright and dark contrast regions is clearly confirmed by EDS experiments. The nanoscale phase separation of 5–10 nm in size has been clarified by HAADF and EDS experiments.