Abstract
A key factor in improving quantum dots electrical properties and dots-based devices is the ability to control the crucial parameters of composition, doping, size, and strain distribution of the dots. We show that nanometer-scale work function measurements using ultrahigh vacuum Kelvin probe force microscopy is capable of measuring the strain and composition variations within and around individual QDs. This is accomplished by analyzing the detailed surface potential profiles in and around InSb/GaAs dots.
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