Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy

Abstract

We developed a frequency-modulation atomic force microscopy (FM-AFM) system combined with Kelvin probe force microscopy (KFM) and scanning capacitance force microscopy (SCFM). Using the developed system, we investigated the surface structure and electrical characteristics of a bulk heterojunction (BHJ) sample consisting of a mixture of [6,6]-phenyl-C61-butyric acid methyl ester (PCBM) and poly(3-hexylthiophene) (P3HT). The BHJ structure consisted of PCBM and P3HT molecules. These materials are often used as the active and charge transport layers in an organic solar cell, respectively. The results suggest that we succeeded in visualizing the phase separation in the BHJ sample using SCFM measurements. We illustrated the energy band diagrams from the KFM results and showed that band bending occurs from the organic material side at the interface with the indium–tin oxide substrate. Furthermore, the KFM and SCFM results suggested that charge separation occurs in the BHJ structure.