Nanoscale Imaging and Force Analysis with Atomic Force Microscopy

Abstract

AbstractThe atomic force microscope – sometimes also referred to as the scanning force microscope – has developed into the most widespread tool used in nanotechnology. The instrument and technique were invented by Binniget al. in 1986, and are today used not only in physical, chemical, biological and medical research laboratories, but also in many companies for tasks such as product development and routine quality control. The success of the technique is based on its high‐resolution imaging capabilities in combination with its versatility, making it possible to image surfaces down to the atomic scale. Due to its universality, atomic force microscopy can be applied to a large variety of samples, and adapted to many different environments (gaseous, liquid, or vacuum). The atomic force microscope can be operated in different modes, which can be categorized as static and dynamic. Here, an introduction is provided of the basic concepts of the two modes, and details applications under different environmental conditions are presented. Some practical issues for the experimentalist are highlighted, while special care is taken to explain the quantitative relationship between experimental parameters and physical magnitudes.