Abstract
We have grown YBa 2Cu 3O 7-δ (YBCO) films on vicinal SrTiO 3(001) surfaces. Scanning tunneling microscopy reveals that their morphology is reminiscent of the regular array of steps on the substrate surface. The resultant film microstructure leads to a pronounced in-plane anisotropy of the resistivity and the critical current density j c . We observed a substantial enhancement of j c up to 8 × 10 11A/m 2 in the nanoscale engineered films.
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