Abstract
Electronic noise measurements were performed at nanoscale by means of Atomic Force Microscopy (AFM). To this aim, a new AFM electrical setup has been developed, which combines the contact‐mode AFM operation with complete custom‐made low noise electronics in a Correlation Spectrum Analyser (CSA) scheme. This new electrical AFM operation mode allows noise measurements with nanometer spatial resolution simultaneously to topographic imaging of materials. Nanoscale noise measurements are particularly suited for biological sample characterisation as an alternative method for resistance extraction at nanoscale, since no electrical bias is required. Noise measurements were tested and results are discussed.
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