Abstract
The nanoscale domain switching behavior of Bi3.15Eu0.85Ti3O12 (BET) thin films annealed at temperatures of 600, 650 and 700 °C is investigated by scanning probe microscopy (SPM) via the direct observation on their domain structure. It is shown that most ferroelectric domains are clearly detectable and confined in the grains. Some domains opposite to the polarizing electric field were observed by SPM, and their formations are attributed to the grain boundaries playing an active roles in pinning a preferential polarization state. The remnant polarization (2Pr) values of BET thin films increase with the annealing temperature due to the increase of nanoscale domains switched into the direction of polarizing electric field.
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