Abstract
The structure of semiconductor crystals Zn1−x V x 2+ Se (x = 0.0018) and Zn1−x Cr x 2+ Se (x = 0.0006) was studied for the first time using thermal neutron diffraction at 300 and 120 K. The diffraction patterns of the crystals were revealed to contain diffuse scattering regions near the Bragg reflections of the initial cubic lattice. The experimental results are discussed in combination with earlier obtained data on neutron diffraction and propagation of ultrasonic waves in Zn1−x Ni x 2+ Se (x = 0.0025) and Zn1−x Cr x 2+ Se (x = 0.0029). The diffuse scattering is shown to be due to nanoscale shear strains of the ZnSe lattice. The character of these strains is determined by Jahn-Teller 3d ions.
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