Abstract
X-ray linear dichroism and X-ray birefringence microscopy are yet to be fully utilized as instruments in the microstructural characterization of crystalline materials. Here, we demonstrate analyser-free X-ray linear dichroism microscopy using spectroscopic hard X-ray ptychography. First experiments enabled a spectroscopic and microstructural characterisation of polycrystalline vanadium pentoxide on the nanoscale, outside of diffraction-contrast based methods.
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